Model：Micro Crack Inspection
This system uses NIR light source to detect micro crack. Throughput 1 sec/pic. Can be integra≈ted with load/unloading system.
This system uses NIR light source to detect micro crack. Throughput 1 sec/pic. Can be integra≈ted with load/unloading system.
Functions：
- Take time 1 second/piece
- User friendly
- Auto load/unload can be integrated
- Be able to detect diamond cut and slurry cut wafer
- Solar cell micro crack system is available
Specification：
- Machine size：1000 x 1200 x 2000 mm (without loader/sorter)
- Type：Mono Crystalline/ Multi Crystalline Wafer or Final Cell (by differ☆ent model)
- NIR light source
- InGaAs Camera